Ultra-Small-Angle X-ray Scattering Facility

X-ray science division, beamline 9ID-C

Documentation

Experiment description for publications from USAXS/SAXS/WAXS instrument

The following short texts are suitable as starting point for Experimental/Instrument description in user publication.

As general rule, it is not advisable to go in complicated details of Bonse-Hart instruments or our SAXS and WAXS configuration. There is no need, this instrument has sufficient number of instrument publications which describe, in detail, instrument setup and everything else which may be of interest to readers. Include following descriptions, modify to meet the style you need and cite the Instrument papers.  The following text is courtesy of Fan Zhang (NIST) who was kind enough to provide these very short but comprehensive descriptions. Note that these are written for 21keV, if your setup used different X-ray energy (ask beamline scientist), you need to modify that number. 

[USAXS + SAXS]

Absolutely-calibrated ultra-small angle X-ray scattering (USAXS) and small angle X-ray scattering (SAXS) experiments were performed using the USAXS instrument at Advanced Photon Source, Argonne National Laboratory. (Ilavsky et al., 2009, Ilavsky et al., 2013) The combined q range is between 1 × 10-4 Å-1 and 1.3 Å-1; here q = 4π/λ sin(θ), λ is the wavelength and θ is ½ of the scattering angle. The X-ray energy was 21 keV (λ = 0.5895 Å). X-ray photon flux was ≈ 1013 mm-2s-1.

[USAXS+SAXS+WAXS]

Absolutely-calibrated ultra-small angle X-ray scattering (USAXS), small angle X-ray scattering (SAXS), and wide-angle X-ray scattering (WAXS) experiments were performed using the USAXS instrument at Advanced Photon Source, Argonne National Laboratory. (Ilavsky et al., 2009, Ilavsky et al., 2013) The combined q range is between 1 × 10-4 Å-1 and 6 Å-1; here q = 4π/λ sin(θ), λ is the wavelength and θ is ½ of the scattering angle. The X-ray energy was 21 keV (λ = 0.5895 Å). X-ray photon flux was ≈ 1013 mm-2s-1. Combined USAXS/SAXS/WAXS measurements had a time resolution of 5 min.

 

Citations:

Ilavsky, J., Jemian, P. R., Allen, A. J., Zhang, F., Levine, L. E. & Long, G. G. (2009). Journal of Applied Crystallography 42, 469-479.

Ilavsky, J., Zhang, F., Allen, A., Levine, L., Jemian, P. & Long, G. (2013). Metallurgical and Materials Transactions A 44, 68-76.